Wire breakage in SLC wire profile monitors

被引:3
|
作者
Field, C [1 ]
McCormick, D [1 ]
Raimondi, P [1 ]
Ross, M [1 ]
机构
[1] Stanford Linear Accelerator Ctr, Stanford, CA 94309 USA
来源
关键词
D O I
10.1063/1.57029
中图分类号
O412 [相对论、场论]; O572.2 [粒子物理学];
学科分类号
摘要
Wire-scanning beam profile monitors are used at the Stanford Linear Collider (SLC) for emittance preservation control and beam optics optimization. Twenty such scanners have proven most useful for this purpose and have performed a total of 1.5 million scans in the 4 to 6 years since their installation. Most of the essential scanners are equipped with 20 to 40 mu m tungsten wires. SLC bunch intensities and sizes often exceed 2x10(7) particles/mu m(2) (3C/m(2)). We believe that this has caused a number of tungsten wire failures that appear at the ends of the wire, near the wire support points, after a few hundred scans are accumulated Carbon fibers, also widely used at SLAG (1), have been substituted in several scanners and have performed well. In this paper, we present theories for the wire failure mechanism and techniques learned in reducing the failures.
引用
收藏
页码:440 / 445
页数:6
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