A SCANNING WIRE BEAM PROFILE MONITOR

被引：9
|
作者：
STEINBACH, C [1 ]
VANROOIJ, M [1 ]
机构：
[1] CERN,CH-1211 GENEVA 23,SWITZERLAND
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1985年 / 32卷 / 05期
关键词：
D O I：
10.1109/TNS.1985.4333767
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1920 / 1922
页数：3
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