Non-EOS Root Causes of EOS-Like Damage

被引:0
|
作者
Righter, Alan [1 ]
Wolfe, Ed [1 ]
Hajjar, Jean-Jacques [1 ]
机构
[1] Analog Devices Inc, Wilmington, MA 01887 USA
来源
2014 36TH ELECTRICAL OVERSTRESS/ELECTROSTATIC DISCHARGE SYMPOSIUM (EOS/ESD) | 2014年
关键词
D O I
暂无
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
Failures resembling damage from electrical overstress (EOS) may not always have their root cause related to a direct EOS transient. The authors describe examples from packaging, manufacturing and test where the damage signature was EOS although the root cause was non-EOS in origin. Containment and/or resolution in each case is reviewed.
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页数:6
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