Direct Measurement of Cryogenic Sapphire Oscillators with Tracking DDSs and 2-Sample Covariance

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作者
Calosso, Claudio E. [1 ]
Vernotte, Francois [2 ]
Giordano, Vincent [3 ]
Fluhr, Christophe [4 ]
Dubois, Benoit [4 ]
Rubiola, Enrico [3 ]
机构
[1] Ist Nazl Ric Metrol INRIM, Div Phys Metrol, Turin, Italy
[2] Observ Besancon, Besancon, France
[3] FEMTO ST Inst, Dept Time & Frequency, Besancon, France
[4] FEMTO Engn, Besancon, France
关键词
ultra stable oscillators; phasemeter; 2-sample covariance; 3-cornered hat;
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摘要
Cryogenic Sapphire Oscillators have very good frequency stability and their measurement is possible only by comparing three similar units. The task is challenging because the short-term instability is significantly lower than the background noise of commercial phasemeters and counters. In this work, we demonstrate the direct ADEV measurement of each CSO at 100 MHz. We use a 6-channel phasemeter based on tracking DDS and then we take advantage of the two-sample covariance that reduces the contribution of the instrument noise for large averaging size. The result is in the low 10(-15) at 1 s.
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页码:41 / 44
页数:4
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