On-Wafer Time-Domain Measurement of Pulse-to-Pulse Stability for Microwave Power GaN HEMT

For the first time, on-wafer time-domain envelope measurements of pulse-to-pulse (P2P) stability are reported in this paper. In the case of a radar burst, these on-wafer measurements are performed on a 10W power GaN HEMT in S-Band by using a digital quadrature demodulation (DQD) as complex envelope extraction technique. The impact of an irregular RF pulse train on the measured P2P stability at device level is illustrated by the influence of load impedance, input power and bias conditions.