Determination of the analytical point spread function of a pinhole aperture SPECT system

被引:0
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作者
Bekaert, V [1 ]
Brasse, D [1 ]
Gizard, B [1 ]
Guyonnet, JL [1 ]
机构
[1] Inst Rech Subatom, F-67037 Strasbourg, France
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中图分类号
TL [原子能技术]; O571 [原子核物理学];
学科分类号
0827 ; 082701 ;
摘要
Pinhole aperture in single photon emission computed tomography (SPECT) imaging system provides high spatial resolution for quantitative measurement. In this paper, we propose a new analytical method to calculate the PSF of a pinhole SPECT system where the response of the crystal is taken into account. The PSF is calculated as the convolution of the pinhole and the crystal responses. A general method to calculate the pinhole response is introduced using a decomposition of the pinhole geometry in single mathematical elements. The crystal response is derived analytically using the distribution of the optical photons on the photodetector surface. As a conclusion, both the pinhole response and the optical distribution give similar results compared to the one obtained with Monte Carlo simulation for a reduced computing time.
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页码:2565 / 2569
页数:5
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