Development of a low temperature scanning probe microscope

被引：6
|
作者：
Saitoh, Kohta [1 ]
Hayashi, Kenichi [1 ]
Shibayama, Yoshiyuki [1 ]
Shirahama, Keiya [1 ]
机构：
[1] Keio Univ, Dept Phys, Yokohama, Kanagawa 2238522, Japan
来源：
JOURNAL OF LOW TEMPERATURE PHYSICS | 2008年 / 150卷 / 3-4期
关键词：
low temperature instrumentation and new techniques;
D O I：
10.1007/s10909-007-9584-6
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
A scanning probe microscope working at low temperatures is developed. Frequency-modulation atomic force microscopy technique with a quartz tuning fork is employed for low temperatures use. Topographic imaging of a diffraction grating is successfully performed down to 1.3 K.
引用
收藏
页码：561 / 566
页数：6
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