Characterization of the noise performance of a cryogenically-cooled HEMT low-noise amplifier

被引：0

作者：

Li, Ning ^{[1
]}

Zuo, Ying-Xi ^{[1
]}

Xu, Jian ^{[1
]}

Ren, Yuan ^{[1
]}

Huang, Shu-Pin ^{[1
]}

Shi, Sheng-Cai ^{[1
]}

机构：

[1] CAS, NAOC, Purple Mt Observ, Nanjing 210008, Jiangsu, Peoples R China

来源：

2008 INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY PROCEEDINGS, VOLS 1-4 | 2008年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper three methods are employed to characterize the equivalent input noise temperature of a cryogenically-cooled IF HEMT LNA. They are the conventional Y-factor method, variable-temperature method and shot-noise method. Through the measurements, their merits and drawbacks are compared.

引用

页码：182 / 185

页数：4

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