A short circuit protection circuit for SiC MOSFET with self-adjustive blanking time

被引:3
|
作者
Liu, Tiantian [1 ,2 ]
Quan, Yuhua [1 ,2 ]
Zhou, Xuetong [1 ,2 ]
Tian, Yufei [1 ,2 ]
Cheng, Xinhong [1 ,2 ]
Huang, Xiaoyi [1 ,2 ]
机构
[1] Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China
[2] Univ Chinese Acad Sci, Ctr Mat Sci & Optoelect Engn, Beijing 100049, Peoples R China
来源
IEICE ELECTRONICS EXPRESS | 2021年 / 18卷 / 21期
基金
中国国家自然科学基金;
关键词
SiC MOSFET; short-circuit protection; blanking time; POWER; INVERTER; MODULE;
D O I
10.1587/elex.18.20210345
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper proposed a desaturation (DESAT) short circuit (SC) protection circuit for SiC MOSFET, where a blanking time setting module and an SC detection module are designed. The fall time of the drain-source voltage (VDS) for each switching period of SiC MOSFET is recorded and set as the blanking time for the hard switching fault (HSF) detection in the next switching period. Consequently, the detection delay for HSF is self-adjustive and can respond quickly to the operating state of SiC MOSFET. FPGA and discrete components are used to implement the proposed circuit. The function of the proposed circuit is verified using the double pulse test. The experiment results show that the blanking time automatically increases with the increase of load current. The default detection delay of the proposed protection circuit is set 240 ns for HSF and can be adjusted during the subsequent switching period. So in the test under a 400 V bus voltage, the detection delay is 240 ns for HSF at the first switching period. And for HSF occurs at the second switching period, the detection delay is 200 ns adjusted according to the operating state of the first switching period. Meanwhile, the detection delay for fault under load (FUL) is 72 ns.
引用
收藏
页数:6
相关论文
共 50 条
  • [1] SiC MOSFET Short Circuit Protection: Design Principles and Circuit
    Dang Z.
    Peng H.
    Peng H.
    Kang Y.
    Zhongguo Dianji Gongcheng Xuebao/Proceedings of the Chinese Society of Electrical Engineering, 2022, 42 (02): : 728 - 736
  • [2] A self-adaptive blanking time circuit for fast IGBT de-saturation short-circuit protection
    Zhu Hongyue
    Cheng Xinhong
    Xia Yifei
    Xu Dawei
    Liu Tiantian
    Zhang Zhenwei
    IEICE ELECTRONICS EXPRESS, 2020, 17 (11):
  • [3] A self-adaptive blanking time circuit for fast IGBT de-saturation short-circuit protection
    Hongyue Z.
    Xinhong C.
    Yifei X.
    Dawei X.
    Tiantian L.
    Zhenwei Z.
    Xinhong, Cheng (xh_cheng@mail.sim.ac.cn), 1600, Institute of Electronics Information Communication Engineers (17)
  • [4] A Digital Signal Processing Based Detection Circuit for Short-Circuit Protection of SiC MOSFET
    Lee, Seungjik
    Kim, Kihyun
    Shim, Minseob
    Nam, Ilku
    IEEE TRANSACTIONS ON POWER ELECTRONICS, 2021, 36 (12) : 13379 - 13382
  • [5] Gate Driver Protection Methods for SiC MOSFET Short Circuit Testing
    Nevarez, Jairo
    Olmedo, Anthony
    Williams, Rachel
    Pechnikova, Polina
    2021 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2021,
  • [6] A Drain Current based Short Circuit Protection technique for SiC MOSFET
    Sukhatme, Yash
    Krishna, Vamshi M.
    Ganesan, P.
    Hatua, Kamalesh
    2018 INTERNATIONAL SYMPOSIUM ON DEVICES, CIRCUITS AND SYSTEMS (ISDCS), 2018,
  • [7] Research on Short-circuit Characteristics and Overcurrent Protection of SiC MOSFET
    Wang Z.
    Tong C.
    Huang W.
    Zhongguo Dianji Gongcheng Xuebao/Proceedings of the Chinese Society of Electrical Engineering, 2020, 40 (18): : 5751 - 5759
  • [8] A Self-Adaptive Blanking Circuit for IGBT Short-Circuit Protection Based on VCE Measurement
    Zhang, Xingyao
    Chen, Min
    Zhu, Nan
    Xu, Dehong
    2015 IEEE ENERGY CONVERSION CONGRESS AND EXPOSITION (ECCE), 2015, : 4125 - 4131
  • [9] Short-circuit Protection Circuit of SiC MOSFET Based on Drain-source Voltage Integral
    Li, Hong
    Wang, Yuting
    Qiu, Zhidong
    Wang, Zuoxing
    Hu, Xiaofei
    Zhao, Jia
    2021 IEEE WORKSHOP ON WIDE BANDGAP POWER DEVICES AND APPLICATIONS IN ASIA (WIPDA ASIA 2021), 2021, : 344 - 349
  • [10] 3300-V SiC MOSFET Short-Circuit Reliability and Protection
    Xing, Diang
    Lyu, Xintong
    Liu, Jiawei
    Xie, Chen
    Agarwal, Anant
    Wang, Jin
    2021 THIRTY-SIXTH ANNUAL IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION (APEC 2021), 2021, : 1262 - 1266