A short circuit protection circuit for SiC MOSFET with self-adjustive blanking time

被引:3
|
作者
Liu, Tiantian [1 ,2 ]
Quan, Yuhua [1 ,2 ]
Zhou, Xuetong [1 ,2 ]
Tian, Yufei [1 ,2 ]
Cheng, Xinhong [1 ,2 ]
Huang, Xiaoyi [1 ,2 ]
机构
[1] Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China
[2] Univ Chinese Acad Sci, Ctr Mat Sci & Optoelect Engn, Beijing 100049, Peoples R China
来源
IEICE ELECTRONICS EXPRESS | 2021年 / 18卷 / 21期
基金
中国国家自然科学基金;
关键词
SiC MOSFET; short-circuit protection; blanking time; POWER; INVERTER; MODULE;
D O I
10.1587/elex.18.20210345
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper proposed a desaturation (DESAT) short circuit (SC) protection circuit for SiC MOSFET, where a blanking time setting module and an SC detection module are designed. The fall time of the drain-source voltage (VDS) for each switching period of SiC MOSFET is recorded and set as the blanking time for the hard switching fault (HSF) detection in the next switching period. Consequently, the detection delay for HSF is self-adjustive and can respond quickly to the operating state of SiC MOSFET. FPGA and discrete components are used to implement the proposed circuit. The function of the proposed circuit is verified using the double pulse test. The experiment results show that the blanking time automatically increases with the increase of load current. The default detection delay of the proposed protection circuit is set 240 ns for HSF and can be adjusted during the subsequent switching period. So in the test under a 400 V bus voltage, the detection delay is 240 ns for HSF at the first switching period. And for HSF occurs at the second switching period, the detection delay is 200 ns adjusted according to the operating state of the first switching period. Meanwhile, the detection delay for fault under load (FUL) is 72 ns.
引用
收藏
页数:6
相关论文
共 50 条
  • [41] Review of Short-circuit Protection Circuits for SiC MOSFETs
    Lee, Seungjik
    Lee, Ockgoo
    Nam, Ilku
    JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, 2023, 23 (02) : 128 - 137
  • [42] Review on Short-Circuit Protection Methods for SiC MOSFETs
    Lyu, Gang
    Ali, Hamid
    Tan, Hongrui
    Peng, Lyuzhang
    Ding, Xiaofeng
    ENERGIES, 2024, 17 (17)
  • [43] Investigation on the Short Circuit Safe Operation Area of SiC MOSFET Power Modules
    Reigosa, Paula Diaz
    Luo, Fiaoze
    Lannuzzo, Francesco
    Blaabjerg, Frede
    2016 IEEE ENERGY CONVERSION CONGRESS AND EXPOSITION (ECCE), 2016,
  • [44] Review and Prospect of Short-circuit Failure and Degradation Mechanism of SiC MOSFET
    Kang J.
    Xin Z.
    Chen J.
    Wang H.
    Li W.
    Zhongguo Dianji Gongcheng Xuebao/Proceedings of the Chinese Society of Electrical Engineering, 2021, 41 (03): : 1069 - 1083
  • [45] Short-Circuit Dynamic Model of SiC MOSFET Considering Failure Modes
    Wang, Ning
    Zhang, Jianzhong
    Deng, Fujin
    IEEE TRANSACTIONS ON POWER ELECTRONICS, 2024, 39 (11) : 14656 - 14669
  • [46] 3.3-kV SiC MOSFET Performance and Short-Circuit Capability
    Xing, Diang
    Xie, Chen
    Wang, Ke
    Liu, Tianshi
    Hu, Boxue
    Wang, Jin
    Agarwal, Anant
    Singh, Ranbir
    Atcitty, Stanley
    2020 IEEE WORKSHOP ON WIDE BANDGAP POWER DEVICES AND APPLICATIONS IN ASIA (WIPDA ASIA), 2020,
  • [47] A Temperature-dependent PSpice Short-circuit Model of SiC MOSFET
    Zhao, Xingran
    Li, Hong
    Wang, Yuting
    Zhou, Zhe
    Sun, Kai
    Zhao, Zhengming
    2019 IEEE WORKSHOP ON WIDE BANDGAP POWER DEVICES AND APPLICATIONS IN ASIA (WIPDA ASIA 2019), 2019,
  • [48] Short-circuit Failure Mechanism of SiC Double-trench MOSFET
    Hu, Dongqing
    Xia, Tian
    Zhou, Xintian
    Jia, Yunpeng
    Wu, Yu
    Yin, Shan
    PROCEEDINGS OF 2020 IEEE 5TH INFORMATION TECHNOLOGY AND MECHATRONICS ENGINEERING CONFERENCE (ITOEC 2020), 2020, : 696 - 699
  • [49] On the short-circuit and avalanche ruggedness reliability assessment of SiC MOSFET modules
    Ionita, Claudiu
    Nawaz, Muhammad
    Ilves, Kalle
    MICROELECTRONICS RELIABILITY, 2017, 71 : 6 - 16
  • [50] Short-circuit Performance of Multi-chip SiC MOSFET Modules
    Kadavelugu, Arun
    Aeloiza, Eddy
    Belcastro, Christopher
    2017 IEEE 5TH WORKSHOP ON WIDE BANDGAP POWER DEVICES AND APPLICATIONS (WIPDA), 2017, : 285 - 290