共 50 条
- [21] INVESTIGATION OF NYLON TEXTURE BY X-RAY DIFFRACTION BRITISH JOURNAL OF APPLIED PHYSICS, 1959, 10 (05): : 225 - 230
- [22] Accounting for secondary extinction in thickness measurement of thin films by X-ray absorption ICOTOM 14: TEXTURES OF MATERIALS, PTS 1AND 2, 2005, 495-497 : 99 - 104
- [25] Planar irregularities of texture and stress field in Ti detected by X-ray diffraction technique NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2010, 268 (3-4): : 352 - 355
- [26] Selective x-ray diffraction from artificially stratified metal films deposited by evaporation PHYSICAL REVIEW, 1935, 48 (08): : 703 - 703
- [27] Texture Measurements on Thin Films Using an X-ray Microfocus Source. ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2009, 65 : S209 - S210
- [30] X-ray diffraction on nanocrystalline Ti1-xAlxN thin films Rafaja, D. (rafaja@ww.tu-freiberg.de), 1600, Elsevier Ltd (378): : 1 - 2