Planar irregularities of texture and stress field in Ti detected by X-ray diffraction technique

被引：0

作者：

Tarkowski, L. ^{[1
]}

Bonarski, J. ^{[1
]}

Alexandrov, I. ^{[2
]}

机构：

[1] Polish Acad Sci, Inst Met & Mat Sci, PL-30059 Krakow, Poland

[2] Ufa State Aviat Tech Univ, Ufa, Russia

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2010年 / 268卷 / 3-4期

关键词：

X-ray texture; Residual stresses; Crystallographic texture;

D O I：

10.1016/j.nimb.2009.09.049

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Regardless of the origin of structure irregularities of materials, the recognition of their spatial distribution in a sample or constructing elements is a great research problem. One of the most effective and non-destructive tools used for this purpose is the X-ray diffraction technique, assisted by an appropriate experimental method and data processing. The work presents the results of investigations of planar distribution of crystallographic texture and stress irregularities manifested by changes of diffraction effects registered by the X-ray technique. As an example, the introduced method is tested on a titanium rod after severe plastic deformation process. (C) 2009 Elsevier B.V. All rights reserved.

引用

页码：352 / 355

页数：4

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