A novel two-dimensional (2-D) defected ground array for planar circuits

被引：0
|
作者：
Liu, HW [1 ]
Sun, XW
Li, ZF
Mao, JF
机构：
[1] Shanghai Jiao Tong Univ, Dept Elect Engn, Shanghai 200030, Peoples R China
[2] Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Shanghai 200050, Peoples R China
来源：
IEICE TRANSACTIONS ON ELECTRONICS | 2004年 / E87C卷 / 01期
关键词：
defected ground array; defected ground structure (DGS); fractal; cutoff frequency; slow-wave factor;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This letter presents a novel two-dimensional (2-D) defected ground array (DGA) for planar circuits, which has horizontal and vertical periodicities of defect structure. The defect unit cell of DGA is composed of a Sierpinski carpet structure to improve the effective inductance. Measurements show that the proposed DGA provides steeper cutoff characteristics, lower cutoff frequency, and higher slow-wave factors than the conventional periodic defected ground structure in the same occupied surface.
引用
收藏
页码：109 / 112
页数：4
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