A novel two-dimensional (2-D) defected ground array for planar circuits

被引：0

作者：

Liu, HW ^{[1
]}

Sun, XW

Li, ZF

Mao, JF

机构：

[1] Shanghai Jiao Tong Univ, Dept Elect Engn, Shanghai 200030, Peoples R China

[2] Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Shanghai 200050, Peoples R China

来源：

IEICE TRANSACTIONS ON ELECTRONICS | 2004年 / E87C卷 / 01期

关键词：

defected ground array; defected ground structure (DGS); fractal; cutoff frequency; slow-wave factor;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This letter presents a novel two-dimensional (2-D) defected ground array (DGA) for planar circuits, which has horizontal and vertical periodicities of defect structure. The defect unit cell of DGA is composed of a Sierpinski carpet structure to improve the effective inductance. Measurements show that the proposed DGA provides steeper cutoff characteristics, lower cutoff frequency, and higher slow-wave factors than the conventional periodic defected ground structure in the same occupied surface.

引用

页码：109 / 112

页数：4

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