Raised source and drain structure of poly-Si TFTs

被引:0
|
作者
He, SS [1 ]
Maa, JS [1 ]
机构
[1] Sharp Microelect Technol Inc, Camas, WA USA
关键词
D O I
暂无
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
By a raised source and drain structure, we can fabricate a Poly-Si TFT with low sheet resistance at its source and drain region and low off stage current with a thin channel silicon region. With the structure, we separated the two fundamental issues for making high quality TFTs. A top gate Poly-Si TFT was fabricated by this technique. The characteristics of the TFTs were compared with conventional implanted source and drain region. To process the structure, we used a selective etching process for n+ film over Poly-Si channel. This technique can be used for large area source and drain doping without any problems regarding surface charging, channel silicon etching, and burned photo resist from ion doping.
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页码:204 / 220
页数:17
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