Reinventing test for DFM and DFT in a sub-100-nm world

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作者：
Wigley, S
Kelly, N
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来源：
IEEE DESIGN & TEST OF COMPUTERS | 2005年 / 22卷 / 03期
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TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
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页码：205 / 205
页数：1
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