Goodness-of-fit tests for semiparametric biased sampling models

被引:8
|
作者
Gilbert, PB
机构
[1] Fred Hutchinson Canc Res Ctr, Stat Ctr HIV AIDS Res & Prevent, Seattle, WA 98109 USA
[2] Univ Washington, Dept Biostat, Seattle, WA 98105 USA
基金
美国国家卫生研究院;
关键词
Anderson-Darling; empirical distributions; Kolmogorov-Smirnov; profile partial likelihood; selection bias; weighted distributions;
D O I
10.1016/S0378-3758(02)00405-6
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
Consider an s-sample biased sampling model in which the distribution function for each of the first s-1 samples is related to the unknown distribution function G of the sth sample by a known parametric selection bias weight function. Gilbert et al. (Biometrika 86 (1999) 27) gave a procedure for semiparametric maximum likelihood estimation of the parameters in this model. In many applications, information are scarce for basing the choice of the parametric weight function(s), motivating the need for goodness-of-fit tests of the hypothesis that the weight functions are correctly specified. Cramer-von Mises-type, Anderson-Darling-type, and Kolmogorov-Smirnov-type test statistics are studied which compare discrepancies between the empirical distribution of G and the semiparametric maximum likelihood estimator of G. Finite-sample properties of the tests are evaluated with simulations and with a real example of HIV genetic sequence data. (C) 2002 Elsevier B.V. All rights reserved.
引用
收藏
页码:51 / 81
页数:31
相关论文
共 50 条
  • [1] Goodness-of-fit tests in semiparametric transformation models
    Colling, Benjamin
    Van Keilegom, Ingrid
    [J]. TEST, 2016, 25 (02) : 291 - 308
  • [2] Goodness-of-fit tests in semiparametric transformation models
    Benjamin Colling
    Ingrid Van Keilegom
    [J]. TEST, 2016, 25 : 291 - 308
  • [3] Goodness-of-fit tests for multinomial models with inverse sampling
    Cho, Hokwon
    [J]. SEQUENTIAL ANALYSIS-DESIGN METHODS AND APPLICATIONS, 2024, 43 (03): : 317 - 331
  • [4] Goodness-of-fit tests for parametric models based on biased samples
    Sun, YQ
    Cui, SF
    Tiwari, RC
    [J]. CANADIAN JOURNAL OF STATISTICS-REVUE CANADIENNE DE STATISTIQUE, 2002, 30 (03): : 475 - 490
  • [5] Goodness-of-fit tests for semiparametric models with multiple event-time data
    Choi, ST
    Jin, ZZ
    Ying, ZL
    [J]. STATISTICA SINICA, 2001, 11 (03) : 723 - 736
  • [6] Goodness-of-fit tests in semiparametric transformation models using the integrated regression function
    Coiling, Benjamin
    Van Keilegom, Ingrid
    [J]. JOURNAL OF MULTIVARIATE ANALYSIS, 2017, 160 : 10 - 30
  • [7] Goodness-of-fit tests for mixed models
    Ritz, C
    [J]. SCANDINAVIAN JOURNAL OF STATISTICS, 2004, 31 (03) : 443 - 458
  • [8] Alternative Goodness-of-Fit Tests for Linear Models
    Christensen, Ronald
    Sun, Siu Kei
    [J]. JOURNAL OF THE AMERICAN STATISTICAL ASSOCIATION, 2010, 105 (489) : 291 - 301
  • [9] Goodness-of-fit tests in conditional duration models
    Meintanis, Simos G.
    Milosevic, Bojana
    Obradovic, Marko
    [J]. STATISTICAL PAPERS, 2020, 61 (01) : 123 - 140
  • [10] Goodness-of-fit test under length-biased sampling
    Jahanshahi, S. M. A.
    Rad, A. Habibi
    Fakoor, V.
    [J]. COMMUNICATIONS IN STATISTICS-THEORY AND METHODS, 2017, 46 (15) : 7580 - 7592