First results of ion trapping in the Dresden EBIT II

被引:3
|
作者
Kentsch, U
Zschornack, G
Grossmann, F
Ovsyannikov, VP
Ullmann, F
机构
[1] Tech Univ Dresden, Inst Kern & Teilchenphys, D-01069 Dresden, Germany
[2] Leybold Vakuum Dresden GmbH, D-01109 Dresden, Germany
来源
HYPERFINE INTERACTIONS | 2003年 / 146卷 / 1-4期
关键词
highly charged ions; ion trap; xenon ions; EBIT;
D O I
10.1023/B:HYPE.0000004244.21906.64
中图分类号
O64 [物理化学(理论化学)、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号
070203 ; 070304 ; 081704 ; 1406 ;
摘要
With the Dresden EBIT it is possible to produce highly charged ions in a compact, economical and long-term stable ion source working at room temperature. The operation principle is based on electron impact ionization of primarily neutral atoms in a high-density electron beam in combination with electrical potentials for axial trapping. Radial trapping is realized by the negative space charge of the electron beam itself. After build-up the first Dresden EBIT in 1999 first results from a second EBIT device, the so-called Dresden EBIT II are presented. By means of X-ray spectroscopy we analyze the influence of different source parameters as ion trapping time, height of wall potentials and pressure on the production and storage of highly charged xenon ions.
引用
收藏
页码:237 / 244
页数:8
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