Line width measurement of semiconductor lasers using quantum interference in electromagnetically induced transparency: a quantum heterodyning method

被引：1
|
作者：
Iftiquar, S. M. [1 ]
机构：
[1] Indian Inst Sci, Dept Phys, Bangalore 560012, Karnataka, India
来源：
OPTICAL ENGINEERING | 2008年 / 47卷 / 06期
关键词：
self-heterodyning; laser spectroscopy; quantum interference; electromagnetically induced transparency;
D O I：
10.1117/1.2948312
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A technique is described in which electromagnetically induced transparency (EIT) spectra are used to measure laser line width. Two independent sets of EIT measurements are carried out in the presence of (85)Rb and (87)Rb atomic isotopes. Conventional self-heterodyning detection is used to obtain standard values of laser line width. A comparison shows that the estimated laser line widths in these measurements are very close to each other. (C) 2008 Society of Photo-Optical Instrumentation Engineers.
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页数：4
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