Neutron detection with cryogenics and semiconductors

被引：26

作者：

Bell, ZW ^{[1
]}

Carpenter, DA ^{[1
]}

Cristy, SS ^{[1
]}

Lamberti, VE ^{[1
]}

Burger, A ^{[1
]}

Woodfield, BF ^{[1
]}

Niedermayr, T ^{[1
]}

Han, ID ^{[1
]}

Labov, SE ^{[1
]}

Friedrich, S ^{[1
]}

West, WG ^{[1
]}

Pohl, KR ^{[1
]}

van den Berg, L ^{[1
]}

机构：

[1] Oak Ridge Natl Lab, Oak Ridge, TN 37831 USA

来源：

PHYSICA STATUS SOLIDI C - CONFERENCES AND CRITICAL REVIEWS, VOL 2, NO 5 | 2005年 / 2卷 / 05期

关键词：

D O I：

10.1002/pssc.200460840

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The common methods of neutron detection are reviewed with special attention paid to the application of cryogenics and semiconductors to the problem. The authors' work with LiF- and boron-based cryogenic instruments is described as well as the use of CdTe and HgI2 for direct detection of neutrons. (c) 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

引用

页码：1592 / 1605

页数：14

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