Neutron detection with cryogenics and semiconductors

被引:26
|
作者
Bell, ZW [1 ]
Carpenter, DA [1 ]
Cristy, SS [1 ]
Lamberti, VE [1 ]
Burger, A [1 ]
Woodfield, BF [1 ]
Niedermayr, T [1 ]
Han, ID [1 ]
Labov, SE [1 ]
Friedrich, S [1 ]
West, WG [1 ]
Pohl, KR [1 ]
van den Berg, L [1 ]
机构
[1] Oak Ridge Natl Lab, Oak Ridge, TN 37831 USA
关键词
D O I
10.1002/pssc.200460840
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The common methods of neutron detection are reviewed with special attention paid to the application of cryogenics and semiconductors to the problem. The authors' work with LiF- and boron-based cryogenic instruments is described as well as the use of CdTe and HgI2 for direct detection of neutrons. (c) 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
引用
收藏
页码:1592 / 1605
页数:14
相关论文
共 50 条