Ultra-High Resolution X-Ray CT System with a CdTe Detector

被引：0
|
作者：
Yoshitake, Junpei [1 ]
Ogawa, Koichi [1 ]
机构：
[1] Hosei Univ, Fac Eng, Dept Elect Informat, Tokyo 1848584, Japan
来源：
2006 IEEE NUCLEAR SCIENCE SYMPOSIUM CONFERENCE RECORD, VOL 1-6 | 2006年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The development of an X-ray CT system with a room temperature semiconductor detector such as CdTe is a challenging project that would enable us to reconstruct an object with a spatial resolution of less than 100 mu m. Moreover the cost of the CdTe detector is relatively cheaper than that of a scintillation detector which is used in a state-of-the-art X-ray CT system. The purpose of this study is to develop an ultra-high resolution X-ray CT system with room temperature semiconductor detector.
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页码：3106 / 3110
页数：5
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