Ultra-High Resolution X-Ray CT System with a CdTe Detector

被引：0

作者：

Yoshitake, Junpei ^{[1
]}

Ogawa, Koichi ^{[1
]}

机构：

[1] Hosei Univ, Fac Eng, Dept Elect Informat, Tokyo 1848584, Japan

来源：

2006 IEEE NUCLEAR SCIENCE SYMPOSIUM CONFERENCE RECORD, VOL 1-6 | 2006年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The development of an X-ray CT system with a room temperature semiconductor detector such as CdTe is a challenging project that would enable us to reconstruct an object with a spatial resolution of less than 100 mu m. Moreover the cost of the CdTe detector is relatively cheaper than that of a scintillation detector which is used in a state-of-the-art X-ray CT system. The purpose of this study is to develop an ultra-high resolution X-ray CT system with room temperature semiconductor detector.

引用

页码：3106 / 3110

页数：5

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