Optical properties of Mn-doped InAs and InMnAs epitaxial films

被引:11
|
作者
Chiu, PT
Blattner, AJ
May, SJ
Wessels, BW
机构
[1] Northwestern Univ, Dept Mat Sci & Engn, Evanston, IL 60208 USA
[2] Northwestern Univ, Ctr Mat Res, Evanston, IL 60208 USA
基金
美国国家科学基金会;
关键词
spintronics; diluted magnetic semiconductors; indium manganese arsenide; infrared spectroscopy; visible reflectance;
D O I
10.1016/j.physb.2003.10.029
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The optical properties of In1-xMnxAs ferromagnetic semiconductors have been measured over the spectral range of 0.05-3.5 eV to determine their electronic structure. For single-phase InMnAs alloy thin films (x<0.01-0.12), a band gap of 0.334 eV, 23 meV lower than InAs, is observed at 295 K. The decrease is attributed to the formation of a shallow manganese impurity band. Reflectance peaks arising from higher lying L-point transitions between the valence band and conduction band are observed in InMnAs thin films. The energy of these transitions decreases with increasing manganese concentration. This demonstrates that the manganese impurity band broadens at the L-point. A broad featureless absorption band was observed between 0.05 and 0.30 eV. This extrinsic absorption band is attributed to light hole to heavy hole inter-valence band transitions. The measured low-frequency optical conductivity is in good agreement with that determined from electrical resistivity measurements. (C) 2003 Elsevier B.V. All rights reserved.
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页码:379 / 384
页数:6
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