Phase transition behaviors and thermal conductivity measurements of nitrogen-doped Sb2Te3 thin films

被引:16
|
作者
Wang, Changzhou [1 ]
Zhai, Jiwei [1 ]
Bai, Suyuan [2 ,3 ]
Yao, Xi [1 ]
机构
[1] Tongji Univ, Funct Mat Res Lab, Shanghai 200092, Peoples R China
[2] Dalian Univ Technol, Dept Elect Engn, Dalian 116024, Peoples R China
[3] Liaoning Normal Univ, Sch Phys & Elect Technol, Dalian 116029, Peoples R China
关键词
Thin films; Sb2Te3; Electrical properties; Atomic force microscopy; Thermal properties;
D O I
10.1016/j.matlet.2010.07.059
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Crystallization temperature of nitrogen-doped Sb2Te3 (ST) thin films increased with increasing nitrogen doping concentration, which indicates that the long-term stability of the metastable amorphous state can be improved by nitrogen doping. The root-mean-square (rms) roughness values of the films showed a significant decrease with nitrogen doping. Thermal conductivity of nitrogen-doped ST thin films was measured using a transient thermoreflectance (TTR) technique. It was found that the thermal conductivity decreased with increasing nitrogen doping concentration and increased with increasing annealing temperature. Nitrogen-doped ST thin films are suitable phase-change materials for low programming power consumption applications of phase-change random access memory (PCRAM). (C) 2010 Elsevier B.V. All rights reserved.
引用
收藏
页码:2314 / 2316
页数:3
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