Correlation of thermo-mechanical properties of adhesives with reliability of FC interconnections

被引:3
|
作者
Miessner, R [1 ]
Aschenbrenner, R [1 ]
Reichl, H [1 ]
机构
[1] Fraunhofer Inst Zuverlassigkeit & Mikrointegrat, D-13355 Berlin, Germany
关键词
D O I
10.1109/ADHES.1998.742045
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This report presents the results of the evaluation of isotropic and anisotropic conductive adhesives for flip chip applications. Samples consist of bumped test chips mounted on fine pitch rigid and flexible substrates. The finest pitch of the rigid FR4 substrates is 150 mu m and for the flexible substrates 100 mu m. Promising candidate for adhesive joining technique are the isotropic conductive adhesives. As they conduct electricity equally in all directions, the material has to be applied precisely onto the points to be connected, and is not allowed to now and short circuit between circuit lines. The anisotropic conductive adhesive materials are prepared by dispersing electrically conductive particles in an adhesive matrix. The concentration assures reliable conductivity between the substrate and the IC electrodes but insulation between adjacent bumps. Several adhesives both commercial and experimental products - were selected to be investigated in this study. A detailed thermo-mechanical analysis was used to characterize the materials according to their physical properties. This kind of analysis method has also been used to optimize the curing profile; i.e. to shorten the curing time. The reliability evaluation was performed with special regard to the degradation and to the interface reactions between polymers and metal surfaces in adhesive contacts. The electrical and mechanical performance of the adhesive bonds were studied by evaluating initial contact resistance and mechanical adhesion as a function of temperature and humidity. Data obtained from reliability testing were correlated with investigated thermo-mechanical properties. Thus we found some simple criteria for adhesive selection for flip chip applications.
引用
收藏
页码:299 / 304
页数:6
相关论文
共 50 条
  • [31] The Thermo-Mechanical and Fluorescent Properties of Polyesters: A Review
    Mishra, Nikita
    Gandhi, Rusvi
    Vasava, Dilip
    POLYMER SCIENCE SERIES B, 2021, 63 (06) : 621 - 639
  • [32] Ceramic composites with improved thermo-mechanical properties
    Sava, B. A.
    Tardei, C.
    Stamatin, I.
    Nastase, C.
    Nastase, F.
    JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2007, 9 (07): : 2056 - 2062
  • [33] Modeling methodology for predicting the thermo-mechanical reliability of electronic packaging
    Thurston, M
    Raiser, G
    Chiang, D
    Tandon, S
    Mello, M
    52ND ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, 2002 PROCEEDINGS, 2002, : 1281 - 1290
  • [34] Effect of Voids on Thermo-Mechanical Reliability of QFN Solder Joints
    Lall, Pradeep
    Kothari, Nakul
    PROCEEDINGS OF THE NINETEENTH INTERSOCIETY CONFERENCE ON THERMAL AND THERMOMECHANICAL PHENOMENA IN ELECTRONIC SYSTEMS (ITHERM 2020), 2020, : 1255 - 1263
  • [35] Thermo-mechanical reliability aspects and finite element simulation in packaging
    Dudek, R
    Auersperg, J
    Michel, B
    Reich, H
    PROCEEDINGS OF 5TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2003, : 440 - 449
  • [36] Numerical analysis for thermo-mechanical reliability of polymers in electronic packaging
    Dudek, Rainer
    Walter, Hans
    Auersperg, Juergen
    Michel, Bernd
    6TH INTERNATIONAL IEEE CONFERENCE ON POLYMERS AND ADHESIVES IN MICROELECTRONICS AND PHOTONICS, PROCEEDINGS 2007, 2007, : 220 - 227
  • [37] Thermo-mechanical reliability of the benzocyclobuten(BCB) film in a WLCSP process
    Lee, KO
    Yu, J
    Kim, JY
    Park, IS
    ADVANCES IN ELECTRONIC MATERIALS AND PACKAGING 2001, 2001, : 84 - 87
  • [38] On thermo-mechanical reliability of plated-through-hole (PTH)
    Su, Fei
    Mao, Ronghai
    Xiong, Ji
    Zhou, Kun
    Zhang, Zheng
    Shao, Jiang
    Xie, Cunyi
    MICROELECTRONICS RELIABILITY, 2012, 52 (06) : 1189 - 1196
  • [39] Analysis on Thermo-Mechanical Reliability of TSV Interposer and Solder Joint
    Xue Tong
    Zhu Yuan
    Ming Xuefei
    Zhang Guohua
    2015 16TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY, 2015,
  • [40] Role of dielectric material and geometry on the thermo-mechanical reliability of microvias
    Ramakrishna, G
    Liu, FH
    Sitaraman, SK
    52ND ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, 2002 PROCEEDINGS, 2002, : 439 - 445