Retiming with interconnect and gate delay

被引:0
|
作者
Chu, C [1 ]
Young, EFY [1 ]
Tong, DKY [1 ]
Dechu, S [1 ]
机构
[1] Iowa State Univ, Dept Elect & Comp Engn, Ames, IA 50011 USA
关键词
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper, we study the problem of retiming of sequential circuits with both interconnect and gate delay. Most retiming algorithms have assumed ideal conditions for the non-logical portions of the data paths, which are not sufficiently accurate to be used in high performance circuits today. In our modeling, we assume that the delay of a wire is directly proportional to its length. This assumption is reasonable since the quadratic component of a wire delay is significantly smaller than its linear component when the more accurate Elmore delay model is used. A simple experiment is conducted to illustrate the validity of this assumption. We present two approaches to solve this problem, both of which have polynomial time complexity. ne first one can compute the optimal clock period while the second one is an improvement over the first one in terms of practical applicability. The second approach gives solutions very close to the optimal (0.13% more than the optimal on average) but in a much shorter runtime. A circuit with more than 22K gates and 32K wires can be optimally retimed in 83.56 seconds by a PC with an 1.8GHz Intel Xeon processor.
引用
收藏
页码:221 / 226
页数:6
相关论文
共 50 条
  • [1] Delay uncertainty reduction by interconnect and gate splitting
    Agarwal, Vineet
    Sun, Jin
    Mitev, Alexander
    Wang, Janet
    PROCEEDINGS OF THE ASP-DAC 2007, 2007, : 690 - +
  • [2] Efficient gate delay modeling for large interconnect loads
    Kahng, AB
    Muddu, S
    1996 IEEE MULTI-CHIP MODULE CONFERENCE, PROCEEDINGS, 1996, : 202 - 207
  • [3] Monitoring Gate and Interconnect Delay Variations by Using Ring Oscillators
    Chen, Ying-Yen
    Lin, Chen-Tung
    Lee, Jin-Nung
    Wu, Chi-Feng
    2011 INTERNATIONAL SYMPOSIUM ON VLSI DESIGN, AUTOMATION AND TEST (VLSI-DAT), 2011, : 145 - 148
  • [4] Interconnect planning with local area constrained retiming
    Lu, RB
    Koh, CK
    DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, PROCEEDINGS, 2003, : 442 - 447
  • [5] Slope Interconnect Effort: Gate-Interconnect Interdependent Delay Modeling for Early CMOS Circuit Simulation
    Hwang, Myeong-Eun
    Jung, Seong-Ook
    Roy, Kaushik
    IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2009, 56 (07) : 1428 - 1440
  • [6] Waveform analysis and delay prediction for a CMOS gate driving RLC interconnect load
    Kaushik, Brajesh Kumar
    Sarkar, Sankar
    Agarwal, R. P.
    INTEGRATION-THE VLSI JOURNAL, 2007, 40 (04) : 394 - 405
  • [7] Post-layout gate sizing for interconnect delay and crosstalk noise optimization
    Hanchate, Narender
    Ranganathan, Nagarajan
    ISQED 2006: PROCEEDINGS OF THE 7TH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN, 2006, : 92 - +
  • [8] Incorporating interconnect, register, and clock distribution delays into the retiming process
    Soyata, T
    Friedman, EG
    Mulligan, JH
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1997, 16 (01) : 105 - 120
  • [9] Slope Interconnect Effort: Gate-Interconnect Interdependent Delay Model for CMOS Logic Gates with Scaled Supply Voltage
    Hwang, Myeong-Eun
    Jung, Seong-Ook
    Roy, Kaushik
    ISLPED'07: PROCEEDINGS OF THE 2007 INTERNATIONAL SYMPOSIUM ON LOW POWER ELECTRONICS AND DESIGN, 2007, : 387 - 390
  • [10] High-Resolution Delay Testing of Interconnect Paths in Field-Programmable Gate Arrays
    Smith, Jack R.
    Xia, Tian
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2009, 58 (01) : 187 - 195