Imaging of silicon carrier dynamics with near-field scanning optical microscopy

被引：0
|
作者：
LaRosa, AH [1 ]
Yakobson, BI [1 ]
Hallen, HD [1 ]
机构：
[1] N CAROLINA STATE UNIV,DEPT PHYS,RALEIGH,NC 27695
来源：
DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS PROCESSING II | 1996年 / 406卷
关键词：
D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
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页码：189 / 194
页数：6
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