Imaging of silicon carrier dynamics with near-field scanning optical microscopy

被引：0
|
作者：
LaRosa, AH [1 ]
Yakobson, BI [1 ]
Hallen, HD [1 ]
机构：
[1] N CAROLINA STATE UNIV,DEPT PHYS,RALEIGH,NC 27695
来源：
DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS PROCESSING II | 1996年 / 406卷
关键词：
D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：189 / 194
页数：6
相关论文
共 50 条
  • [31] SCANNING NEAR-FIELD OPTICAL MICROSCOPY (SNOM)
    POHL, DW
    FISCHER, UC
    DURIG, UT
    JOURNAL OF MICROSCOPY-OXFORD, 1988, 152 : 853 - 861
  • [32] Photoreflectance Near-field Scanning Optical Microscopy
    Paulson, C
    Hawkins, B
    Sun, JX
    Ellis, AB
    McCaughan, L
    Kuech, TF
    OPTICAL MICROSTRUCTURAL CHARACTERIZATION OF SEMICONDUCTORS, 2000, 588 : 13 - 17
  • [33] Differential near-field scanning optical microscopy
    Ozcan, Aydogan
    Cubukcu, Ertugrul
    Bilenca, Alberto
    Crozier, Kenneth B.
    Bouma, Brett E.
    Capasso, Federico
    Tearney, Guillermo J.
    NANO LETTERS, 2006, 6 (11) : 2609 - 2616
  • [34] Contact scanning near-field optical microscopy
    Lapshin, D.A.
    Reshetov, V.N.
    Sekatskii, S.K.
    Letokhov, V.S.
    JETP Letters (Translation of Pis'ma v Zhurnal Eksperimental'noi Teoreticheskoi Fiziki), 1998, 67 (04):
  • [35] Applications of near-field scanning optical microscopy
    Hess, HF
    Betzig, E
    SEMICONDUCTOR CHARACTERIZATION: PRESENT STATUS AND FUTURE NEEDS, 1996, : 395 - 398
  • [36] Near-field scanning optical microscopy of nanostructures
    DeAro, JA
    Weston, KD
    Buratto, SK
    PHASE TRANSITIONS, 1999, 68 (01) : 27 - 57
  • [37] NEAR-FIELD OPTICAL-SCANNING MICROSCOPY
    DURIG, U
    POHL, DW
    ROHNER, F
    JOURNAL OF APPLIED PHYSICS, 1986, 59 (10) : 3318 - 3327
  • [38] Contact scanning near-field optical microscopy
    D. A. Lapshin
    S. K. Sekatskii
    V. S. Letokhov
    V. N. Reshetov
    Journal of Experimental and Theoretical Physics Letters, 1998, 67 : 263 - 268
  • [39] Scanning near-field optical microscopy (SNOM)
    Cricenti, A.
    PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 5, NO 8, 2008, : 2615 - 2620
  • [40] Near-field scanning optical microscopy nanoprobes
    Fleischer, Monika
    NANOTECHNOLOGY REVIEWS, 2012, 1 (04) : 313 - 338
12345