共 50 条
- [42] METHOD OF DETECTING MISSING METALLIZATION LAYERS IN EVAPORATED C-4 STRUCTURE. IBM technical disclosure bulletin, 1986, 29 (01): : 300 - 301
- [43] Group-theoretic approach to enhancing the Fourier modal method for crossed gratings with C4 symmetry JOURNAL OF OPTICS A-PURE AND APPLIED OPTICS, 2005, 7 (12): : 783 - 789
- [44] ACCURATE, NON-DESTRUCTIVE, RAPID AUTOMATABLE METHOD TO MEASURE C4 VOLUMES AND HEIGHTS. IBM technical disclosure bulletin, 1983, 26 (01): : 248 - 250