Peculiarity of depletion region in diamond pn-junction

被引:13
|
作者
Koide, Y [1 ]
机构
[1] Natl Inst Mat Sci, Adv Mat Lab, Tsukuba, Ibaraki 3050044, Japan
关键词
diamond; pn-junction; phosphorus donor; boron acceptor; deep dopant; carrier profile; space-charge layer; depletion layer; bipolar transistor;
D O I
10.1143/JJAP.42.6800
中图分类号
O59 [应用物理学];
学科分类号
摘要
Ionized dopant and carrier profiles in the pn-junction of diamond with a deep phosphorus donor and a boron acceptor are theoretically analyzed by simply solving a one-dimensional Poisson equation. The width of the depletion layer is around two times larger than that of the space-charge layer since there exists a transition region at the depletion layer edge. The difference between these widths is reduced with increasing temperature. It is predicted that the static saturation property of a bipolar pnp-junction transistor is affected by the large width of the depletion layer. A base donor density higher than high-10(18) cm(-3) is required for an acceptor density of 1 x 10(18) cm(-3) in the collector to obtain an Early voltage larger than 100V. Similarly, a punch-through voltage is extremely reduced by the deep dopant effect. However, the deep dopant effect is weakened with increasing temperature.
引用
收藏
页码:6800 / 6803
页数:4
相关论文
共 50 条
  • [31] A FULL DYNAMIC-MODEL FOR PN-JUNCTION DIODE SWITCHING TRANSIENTS
    DARLING, RB
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1995, 42 (05) : 969 - 976
  • [32] A COMPUTER SOLUTION FOR STEADY-STATE BEHAVIOUR OF A PN-JUNCTION DIODE
    FULKERSON, DE
    NUSSBAUM, A
    SOLID-STATE ELECTRONICS, 1966, 9 (07) : 709 - +
  • [33] Electrical behavior of cement-based junctions including the pn-junction
    Wen, SH
    Chung, DDL
    CEMENT AND CONCRETE RESEARCH, 2001, 31 (01) : 129 - 133
  • [34] How to improve lateral pn-junction electron detectors for microcolumn systems
    Fritz, GS
    Prins, FE
    Kern, DP
    MICROELECTRONIC ENGINEERING, 2001, 57-8 : 199 - 205
  • [35] Homogeneous Palladium Diselenide pn-Junction Diodes for Reconfigurable Circuit Applications
    Lee, Minjong
    Park, Chang Yong
    Sim, Sangjun
    Lee, Kimoon
    Lee, Young Tack
    ADVANCED ELECTRONIC MATERIALS, 2022, 8 (10)
  • [36] CAPACITANCE MODULATION OF A TUNNEL-DIODE PN-JUNCTION BY A SINUSOIDAL SIGNAL
    ILIN, VV
    TELECOMMUNICATIONS AND RADIO ENGINEER-USSR, 1967, (06): : 144 - &
  • [37] Rapid thermal annealing of Si paste film and pn-junction formation
    Zhu, Huan
    Sakamoto, Morihiro
    Pan, Ting
    Fujisaki, Takaya
    Matsumoto, Hiroshige
    Teii, Kungen
    Kato, Yoshimine
    NANOTECHNOLOGY, 2020, 31 (38)
  • [38] pn-junction delineation in Si devices using scanning capacitance spectroscopy
    Edwards, H
    ISTFA 2000: PROCEEDINGS OF THE 26TH INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2000, : 529 - 532
  • [39] Doping control and evaluation of pn-junction LED in GaPN grown by OMVPE
    Hatakenaka, Susumu
    Nakanishi, Yoshiyuki
    Wakahara, Akihiro
    Furukawa, Yuzo
    Okada, Hiroshi
    JOURNAL OF CRYSTAL GROWTH, 2008, 310 (23) : 5147 - 5150
  • [40] pn-junction delineation in Si devices using scanning capacitance spectroscopy
    Edwards, H
    Ukraintsev, VA
    San Martin, R
    Johnson, FS
    Menz, P
    Walsh, S
    Ashburn, S
    Wills, KS
    Harvey, K
    Chang, MC
    JOURNAL OF APPLIED PHYSICS, 2000, 87 (03) : 1485 - 1495