Interfacial fluctuations near the critical filling transition -: art. no. 031602

被引：5

作者：

Bednorz, A ^{[1
]}

Napiórkowski, M ^{[1
]}

机构：

[1] Univ Warsaw, Inst Theoret Phys, PL-00681 Warsaw, Poland

来源：

PHYSICAL REVIEW E | 2001年 / 63卷 / 03期

关键词：

Euler constant;

D O I：

10.1103/PhysRevE.63.031602

中图分类号：

O35 [流体力学]; O53 [等离子体物理学];

学科分类号：

070204 ; 080103 ; 080704 ;

摘要：

We advance a method to describe the short-distance fluctuations of an interface spanning a wedge-shaped substrate near the critical filling transition. Two different length scales determined by the average distance of the interface From the substrate at the wedge center can be identified. On one length scale, the one-dimensional approximation of A. O. parry, C. Rascon, and A. J. Wood [Phys. Rev. Lett. 85, 345 (2000)], which allows one to determine the interfacial critical exponents, is extracted from the full description. On the other scale, the short-distance fluctuations are analyzed by mean-field theory.

引用

页码：031602 / 031602

页数：6

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