The concept of "threshold voltage" in organic field-effect transistors

被引:0
|
作者
Horowitz, G
Hajlaoui, R
Bouchriha, H
Bourguiga, R
Hajlaoui, M
机构
[1] CNRS, Mat Mol Lab, F-94320 Thiais, France
[2] Fac Sci Tunis, Phys Mat Condensee Lab, Tunis 1060, Tunisia
关键词
D O I
10.1002/(SICI)1521-4095(199808)10:12<923::AID-ADMA923>3.0.CO;2-W
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The performance of organic field-effect transistors (OFETs) has improved substantially in recent years. Their field-effect mobilities are now comparable to that of hydrogenated amorphous silicon thin-film transistors (TFTs). Both TFTs and OFETs operate in the accumulation regime and the authors here develop a comprehensive model for OFETs in this regime. They show that, in the case of a constant mobility, a threshold voltage cannot be defined. The threshold voltage observed in practice is attributed to a gate-voltage-dependent mobility.
引用
下载
收藏
页码:923 / +
页数:6
相关论文
共 50 条
  • [21] Effect of built-in potential under drain electrodes on threshold voltage of organic field-effect transistors
    Suemori, Kouji
    Uemura, Sei
    Yoshida, Manabu
    Hoshino, Satoshi
    Kodzasa, Takehito
    Kamata, Toshihide
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 2007, 46 (36-40): : L883 - L885
  • [22] Synthesis of ultrathin, homogeneous copolymer dielectrics to control threshold voltage of organic field-effect transistors
    Pak, Kwanyong
    Seong, Hyejeong
    Choi, Junhwan
    Hwang, Wan Sik
    Im, Sung Gap
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2018, 256
  • [23] Tuning the threshold voltage by inserting a thin molybdenum oxide layer into organic field-effect transistors
    Guo, Yunlong
    Liu, Yunqi
    Di, Chong-an
    Yu, Gui
    Wu, Weiping
    Ye, Shanghui
    Wang, Ying
    Xu, Xinjun
    Sun, Yanming
    APPLIED PHYSICS LETTERS, 2007, 91 (26)
  • [24] Threshold voltage stability of organic field-effect transistors for various chemical species in the insulator surface
    Suemori, Kouji
    Uemura, Sei
    Yoshida, Manabu
    Hoshino, Satoshi
    Takada, Noriyuki
    Kodzasa, Takehito
    Kamata, Toshihide
    APPLIED PHYSICS LETTERS, 2007, 91 (19)
  • [25] Influence of fine roughness of insulator surface on threshold voltage stability of organic field-effect transistors
    Suemori, Kouji
    Uemura, Sei
    Yoshida, Manabu
    Hoshino, Satoshi
    Takada, Noriyuki
    Kodzasa, Takehito
    Kamata, Toshihide
    APPLIED PHYSICS LETTERS, 2008, 93 (03)
  • [26] Revealing Buried Interfaces to Understand the Origins of Threshold Voltage Shifts in Organic Field-Effect Transistors
    Mathijssen, Simon G. J.
    Spijkman, Mark-Jan
    Andringa, Anne-Marije
    van Hal, Paul A.
    McCulloch, Iain
    Kemerink, Martijn
    Janssen, Rene A. J.
    de Leeuw, Dago M.
    ADVANCED MATERIALS, 2010, 22 (45) : 5105 - +
  • [27] Fundamental insights into the threshold characteristics of organic field-effect transistors
    Jung, Sungyeop
    Kim, Chang-Hyun
    Bonnassieux, Yvan
    Horowitz, Gilles
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2015, 48 (03)
  • [28] On the threshold voltage of metal-oxide-semiconductor field-effect transistors
    Shi, XJ
    Wong, M
    SOLID-STATE ELECTRONICS, 2005, 49 (07) : 1179 - 1184
  • [29] Percolation model for the threshold voltage of field-effect transistors with nanocrystalline channels
    Steinke, I. P.
    Ruden, P. P.
    JOURNAL OF APPLIED PHYSICS, 2012, 111 (01)
  • [30] ANALYSIS OF ANNEALING EFFECT ON THE THRESHOLD VOLTAGE UNIFORMITY OF GAAS FIELD-EFFECT TRANSISTORS
    WATANABE, K
    HYUGA, F
    INOUE, N
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1991, 138 (09) : 2815 - 2820