A Comparative Study for the Junction Temperature of Green Light-Emitting Diodes

被引:9
|
作者
Ozluk, Burak [1 ]
Muslu, A. Mete [1 ]
Arik, Mehmet [1 ]
机构
[1] Ozyegin Univ, Dept Mech Engn, TR-34662 Istanbul, Turkey
关键词
Forward voltage technique; green light-emitting diode (LED); junction temperature measurement; LED; LED lens; thermal imaging;
D O I
10.1109/TCPMT.2019.2929172
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Solid-state lighting devices offer a wide variety of color options applicable for general and automotive lighting, various display systems, and a number of niche applications. As they get smaller, generated heat fluxes become more intense and induce serious lifetime and performance issues. Although the light output from light-emitting diodes (LEDs) is the most efficient at a narrow optical spectrum compared with conventional lighting sources, they are still not adequate to satisfy consumer demands due to considerable amounts of lost energy and emerging thermal issues. On the other hand, it is possible to achieve effective thermal solutions if the junction temperature of LEDs is precisely determined. A number of techniques have been proposed for the junction temperature measurement of LEDs such as forward voltage change and infrared (IR) thermal imaging. In this study, green LEDs were studied to observe optothermal interactions using a number of proposed junction temperature measurement techniques. The effect of an LED lens on junction temperature and optical extraction was investigated by examining the change in the thermal and optical properties of an LED chip after the LED lens was removed. In addition, the results of the green LED were compared with a 450-nm blue LED and verified with numerical findings. As a result, it has been determined that the thermal behavior of LEDs is significantly affected by electrical conditions, since the junction temperature of green and blue LEDs has risen by around 45% after the operating current has been increased from 200 to 500 mA.
引用
下载
收藏
页码:2024 / 2035
页数:12
相关论文
共 50 条
  • [21] An electrical model with junction temperature for light-emitting diodes and the impact on conversion efficiency
    Park, J
    Lee, CC
    IEEE ELECTRON DEVICE LETTERS, 2005, 26 (05) : 308 - 310
  • [22] Green phosphorescent dendrimer for light-emitting diodes
    Lo, SC
    Male, NAH
    Markham, JPJ
    Magennis, SW
    Burn, PL
    Salata, OV
    Samuel, IDW
    ADVANCED MATERIALS, 2002, 14 (13-14) : 975 - +
  • [23] Frontiers in Green Perovskite Light-Emitting Diodes
    Yu, Runnan
    Li, Changxiao
    Zhao, Biao
    Tan, Zhan'ao
    LASER & PHOTONICS REVIEWS, 2024, 18 (04)
  • [24] MULTICOLOR LIGHT-EMITTING DIODES WITH DOUBLE JUNCTION STRUCTURE
    SAITOH, T
    MINAGAWA, S
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1975, ED22 (02) : 29 - 32
  • [25] A Reliability Study on Green InGaN-GaN Light-Emitting Diodes
    Li, Z. L.
    Lai, P. T.
    Choi, H. W.
    IEEE PHOTONICS TECHNOLOGY LETTERS, 2009, 21 (19) : 1429 - 1431
  • [26] TEMPERATURE-DEPENDENCE OF EMISSION FROM RED AND GREEN LIGHT-EMITTING DIODES
    DAVIS, JA
    MUELLER, MW
    AMERICAN JOURNAL OF PHYSICS, 1977, 45 (08) : 770 - 771
  • [27] Effect of Thinning Encapsulant Layer on Junction and Phosphor Temperature of White Light-Emitting Diodes
    Huang, Linjuan
    Shih, Yu-Chou
    Shi, Frank G.
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2015, 5 (11): : 1628 - 1634
  • [28] A Technique for Improving the Precision of the Direct Measurement of Junction Temperature in Power Light-Emitting Diodes
    Iero, Demetrio
    Merenda, Massimo
    Carotenuto, Riccardo
    Pangallo, Giovanni
    Rao, Sandro
    Brezeanu, Gheorghe
    Della Corte, Francesco G.
    SENSORS, 2021, 21 (09)
  • [29] Research on the junction-temperature characteristic of GaN light-emitting diodes on Si substrate
    Jiang, Fengyi
    Liu, Weihua
    Li, Youqun
    Fang, Wenqing
    Mo, Chunlan
    Zhou, Maoxing
    Liu, Hechu
    JOURNAL OF LUMINESCENCE, 2007, 122 (693-695) : 693 - 695
  • [30] A Continuous Rectangular-Wave Method for Junction Temperature Measurement of Light-Emitting Diodes
    Liu, Ze-Hui
    Huang, Jia-En
    Gao, Yu-Lin
    Guo, Zi-Quan
    Lin, Yue
    Zhu, Li-Hong
    Chen, Zhong
    Lu, Yi-Jun
    IEEE TRANSACTIONS ON POWER ELECTRONICS, 2019, 34 (11) : 10414 - 10424