Investigation of parameters of thin films deposited on planar waveguides

被引：4

作者：

Augusciuk, E ^{[1
]}

Roszko, M ^{[1
]}

Fabianowski, W ^{[1
]}

机构：

[1] Warsaw Univ Technol, Fac Phys, Warsaw, Poland

来源：

LIGHTGUIDES AND THEIR APPLICATIONS | 2000年 / 4239卷

关键词：

waveguide; optical sensors;

D O I：

10.1117/12.409183

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Using the method of m-line spectroscopy [1] it is possible to determine parameters (thickness and refractive index) of thin films deposited on planar waveguides through indirect measurement of changes of coupling angle to the waveguide. The subject of the study were thin organic films deposited on waveguides by casting diluted polymerizable solutions, and by spin-coating thin polyimide films. These films are developed as active coatings in waveguide sensors. Numerical calculations (applied for three-layer structures) after modification to a four-layer structure allows for determining the parameters of thin films.

引用

页码：168 / 170

页数：3

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