Investigation of parameters of thin films deposited on planar waveguides

被引：4
|
作者：
Augusciuk, E [1 ]
Roszko, M [1 ]
Fabianowski, W [1 ]
机构：
[1] Warsaw Univ Technol, Fac Phys, Warsaw, Poland
来源：
LIGHTGUIDES AND THEIR APPLICATIONS | 2000年 / 4239卷
关键词：
waveguide; optical sensors;
D O I：
10.1117/12.409183
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Using the method of m-line spectroscopy [1] it is possible to determine parameters (thickness and refractive index) of thin films deposited on planar waveguides through indirect measurement of changes of coupling angle to the waveguide. The subject of the study were thin organic films deposited on waveguides by casting diluted polymerizable solutions, and by spin-coating thin polyimide films. These films are developed as active coatings in waveguide sensors. Numerical calculations (applied for three-layer structures) after modification to a four-layer structure allows for determining the parameters of thin films.
引用
收藏
页码：168 / 170
页数：3
相关论文
共 50 条
  • [1] Chalcogenide glass thin films and planar waveguides
    Curry, RJ
    Mairaj, AK
    Huang, CC
    Eason, RW
    Grivas, C
    Hewak, DW
    Badding, JV
    JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2005, 88 (09) : 2451 - 2455
  • [2] Thin films of block copolymers as planar optical waveguides
    Kim, DH
    Lau, KHA
    Robertson, JWF
    Lee, OJ
    Jeong, U
    Lee, JI
    Hawker, CJ
    Russell, TP
    Kim, JK
    Knoll, W
    ADVANCED MATERIALS, 2005, 17 (20) : 2442 - +
  • [3] Thin films of block copolymers as planar optical waveguides.
    Kim, DH
    Robertson, JWF
    Lee, OJ
    Jeong, U
    Lee, JI
    Hawker, CJ
    Russell, TP
    Kim, JK
    Knoll, W
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2005, 229 : U1120 - U1120
  • [4] An investigation on SILAR deposited CuxS thin films
    Astam, Aykut
    Akaltun, Yunus
    Yildirim, Muhammet
    TURKISH JOURNAL OF PHYSICS, 2014, 38 (02): : 245 - 252
  • [5] Mounted Nanoporous Anodic Alumina Thin Films as Planar Optical Waveguides
    Lazzara, Thomas D.
    Lau, K. H. Aaron
    Knoll, Wolfgang
    JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2010, 10 (07) : 4293 - 4299
  • [6] CONDUCTION PARAMETERS IN CHEMICALLY DEPOSITED THIN SILVER FILMS
    PICHARD, CR
    DREXLER, JP
    TOSSER, AJ
    FLECHON, J
    JOURNAL OF MATERIALS SCIENCE, 1983, 18 (08) : 2414 - 2418
  • [7] Investigation of the process parameters influence on the growth of YBCO thin films deposited by excimer laser ablation
    Chakalov, RA
    Ivanov, ZG
    Larsson, P
    Tomov, RI
    NINTH INTERNATIONAL SCHOOL ON QUANTUM ELECTRONICS: LASERS-PHYSICS AND APPLICATIONS, 1996, 3052 : 352 - 356
  • [8] INVESTIGATION OF THE MULTILAYER DEPOSITED BISRCACUO THIN-FILMS
    JIE, BB
    WANG, SL
    BAO, ZL
    WANG, FR
    LI, CY
    LI, G
    WANG, SZ
    YIN, DL
    IEEE TRANSACTIONS ON MAGNETICS, 1989, 25 (02) : 2448 - 2450
  • [9] Investigation on Laser cleaning of thin films deposited on Sapphire
    Palani, I. A.
    Kumeda, A.
    Matsumoto, T.
    Higashihata, M.
    Okada, T.
    2009 LASERS & ELECTRO-OPTICS & THE PACIFIC RIM CONFERENCE ON LASERS AND ELECTRO-OPTICS, VOLS 1 AND 2, 2009, : 1059 - +
  • [10] Investigation on chemical bath deposited CdS thin films
    Moualkia, H.
    Attaf, N.
    Hadjeris, L.
    Herissi, L.
    Abdelmalek, N.
    JOURNAL OF NEW TECHNOLOGY AND MATERIALS, 2011, 1 : 47 - 50
12345