The Impact of Production Defects on the Soft-Error Tolerance of Hardened Latches

被引：0
|
作者：
Holst, Stefan [1 ]
Ma, Ruijun [1 ]
Wen, Xiaoqing [1 ]
机构：
[1] Kyushu Inst Technol, Iizuka, Fukuoka 8208502, Japan
来源：
2018 23RD IEEE EUROPEAN TEST SYMPOSIUM (ETS) | 2018年
关键词：
soft-error vulnerability; test escapes; latent defects; DEEP-SUBMICRON TECHNOLOGIES; HIGH-PERFORMANCE; DESIGN; RESILIENCE; CIRCUITS;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
As modern technology nodes get more and more susceptible to soft-errors, various hardened latch cells have been proposed. The added redundancy used to tolerate transient faults in the field at the same time reduces the test coverage of cell-internal production defects. Moreover, the test escapes reduce the soft-error tolerance of the defective latches. This work introduces a new soft-error vulnerability metric called Post Test Vulnerability Factor that correctly measures the added vulnerability to transient faults such as particle strikes caused by undiscovered production defects within hardened latches.
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页数：6
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