An electron cyclotron resonance ion source based low energy ion beam platform

被引：1
|
作者：
Sun, L. T. [1 ]
Shang, Y. [1 ,2 ]
Ma, B. H. [1 ]
Zhang, X. Z. [1 ]
Feng, Y. C. [1 ]
Li, X. X. [1 ]
Wang, H. [1 ]
Guo, X. H. [1 ]
Song, M. T. [1 ]
Zhao, H. Y. [1 ,2 ]
Zhang, Z. M. [1 ]
Zhao, H. W. [1 ]
Xie, D. Z. [3 ]
机构：
[1] Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China
[2] Chinese Acad Sci, Grad Sch, Beijing 100039, Peoples R China
[3] Berkeley Ion Equipment Inc, Santa Clara, CA 95054 USA
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2008年 / 79卷 / 02期
基金：
中国国家自然科学基金;
关键词：
Atomic physics - Electron cyclotron resonance - Ion beams - Permanent magnets;
D O I：
10.1063/1.2821504
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
To satisfy the requirements of surface and atomic physics study in the field of low energy multiple charge state ion incident experiments, a low energy (10 eV/q-20 keV/q) ion beam platform is under design at IMP A simple test bench has been set up to test the ion beam deceleration systems. Considering virtues such as structure simplicity, easy handling, compactness, cost saving, etc., an all-permanent magnet ECRIS LAPECR1 [Lanzhou all-permanent magnet electron cyclotron resonance (ECR) ion source No. 1] working at 14.5 GHz has been adopted to produce intense medium and low charge state ion beams. LAPECR1 source has already been ignited. Some intense low charge state ion beams have been produced on it, but the first test also reveals that many problems are existing on the ion beam transmission line. The ion beam transmission mismatches result in the depressed performance of LAPECR1, which will be discussed in this paper. To obtain ultralow energy ion beam, after being analyzed by a double-focusing analyzer magnet, the selected ion beam will be further decelerated by two afocal deceleration lens systems, which is still under design. This design has taken into consideration both ions slowing down and also ion beam focusing. In this paper, the conceptual design of deceleration system will be discussed. (C) 2008 American Institute of Physics.
引用
收藏
页数：4
相关论文
共 50 条
  • [41] Influence of electron cyclotron resonance ion source parameters on high energy electrons
    Li, J. B.
    Li, L. X.
    Li, L. B.
    Guo, J. W.
    Hitz, D.
    Lu, W.
    Feng, Y. C.
    Zhang, W. H.
    Zhang, X. Z.
    Zhao, H. Y.
    Sun, L. T.
    Zhao, H. W.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2020, 91 (08):
  • [42] Characteristics of the KVI electron cyclotron resonance ion source
    Kremers, H. R.
    Beijers, J. P. M.
    Brandenburg, S.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2006, 77 (03):
  • [43] ECR ion source based low energy ion beam facility
    Kumar, P
    Rodrigues, G
    Rao, UK
    Safvan, CP
    Kanjilal, D
    Roy, A
    PRAMANA-JOURNAL OF PHYSICS, 2002, 59 (05): : 805 - 809
  • [44] ECR ion source based low energy ion beam facility
    P Kumar
    G Rodrigues
    U K Rao
    C P Safvan
    D Kanjilal
    A Roy
    Pramana, 2002, 59 : 805 - 809
  • [45] A double-layer based model of ion confinement in electron cyclotron resonance ion source
    Mascali, D.
    Neri, L.
    Celona, L.
    Castro, G.
    Torrisi, G.
    Gammino, S.
    Sorbello, G.
    Ciavola, G.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2014, 85 (02):
  • [46] Beam experiments with the Grenoble test electron cyclotron resonance ion source at iThemba LABS
    Thomae, R.
    Conradie, J.
    Fourie, D.
    Mira, J.
    Nemulodi, F.
    Kuechler, D.
    Toivanen, V.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2016, 87 (02):
  • [47] Beam development at the new 14 GHz electron cyclotron resonance ion source of ATOMKI
    Biri, S
    Vamosi, J
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (02): : 646 - 648
  • [48] Spatially resolved measurements of electron cyclotron resonance ion source beam profile characteristics
    Panitzsch, Lauri
    Stalder, Michael
    Wimmer-Schweingruber, Robert F.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2011, 82 (03):
  • [49] Experimental study on the electric-sweep scanner and ion beam emittance of electron cyclotron resonance ion source
    Cao, Y.
    Sun, L. T.
    Ma, L.
    Ma, B. H.
    Wang, H.
    Feng, Y. C.
    Li, J. Y.
    Zhao, H. W.
    Zhang, Z. M.
    Zhang, X. Z.
    He, W.
    Zhao, H. Y.
    Guo, X. H.
    Li, X. X.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2006, 77 (03):
  • [50] Study of ion beam transport from the SECRAL electron cyclotron resonance ion source at the Institute of Modern Physics
    Cao, Y.
    Lu, W.
    Zhang, W. H.
    Sha, S.
    Yang, Y.
    Ma, B. H.
    Wang, H.
    Zhu, Y. H.
    Guo, J. W.
    Fang, X.
    Lin, S. H.
    Li, X. X.
    Feng, Y. C.
    Li, J. Y.
    Zhao, H. Y.
    Ma, H. Y.
    Zhang, X. Z.
    Guo, X. H.
    Wu, Q.
    Sun, L. T.
    Zhao, H. W.
    Xie, D. Z.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2012, 83 (02):
12345