Use of dielectrophoresis in the fabrication of an atomic force microscope tip with a carbon nanotube: a numerical analysis

被引:53
|
作者
Kim, JE [1 ]
Han, CS [1 ]
机构
[1] KIMM, Nano Mech Syst Res Ctr, Taejon 305343, South Korea
关键词
D O I
10.1088/0957-4484/16/10/046
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
To fabricate an atomic force microscope tip with an attached carbon nanotube (CNT), we simulated dielectrophoresis, produced by a nonuniform electric field. We calculated the dielectrophoretic force and torque of CNTs dispersed in a fluid. We then investigated the effect of various parameters such as the initial conditions of the CNT, the distance between the tip and the electrode, and the shape of the tip's apex. Using the results of the simulation, we examined the assembly conditions for achieving a high success rate. In particular, we found that the optimal distance between the tip and the electrode was 10 gm.
引用
收藏
页码:2245 / 2250
页数:6
相关论文
共 50 条
  • [31] THERMOMECHANICAL WRITING WITH AN ATOMIC FORCE MICROSCOPE TIP
    MAMIN, HJ
    RUGAR, D
    [J]. APPLIED PHYSICS LETTERS, 1992, 61 (08) : 1003 - 1005
  • [32] TIP RECONSTRUCTION FOR THE ATOMIC-FORCE MICROSCOPE
    MILLER, R
    VESENKA, J
    HENDERSON, E
    [J]. SIAM JOURNAL ON APPLIED MATHEMATICS, 1995, 55 (05) : 1362 - 1371
  • [33] An atomic force microscope tip as a light source
    Lulevich, V
    Honig, C
    Ducker, WA
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2005, 76 (12): : 1 - 5
  • [34] Trapping Protein Molecules at a Carbon Nanotube Tip using Dielectrophoresis
    Maruyama, Hiroyuki
    Nakayama, Yoshikazu
    [J]. APPLIED PHYSICS EXPRESS, 2008, 1 (12) : 1240011 - 1240013
  • [35] Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces
    Klapetek, P
    Ohlídal, I
    Bílek, J
    [J]. ULTRAMICROSCOPY, 2004, 102 (01) : 51 - 59
  • [36] Atomic force microscopy. of steep sidewalled feature with carbon nanotube tip
    Park, BC
    Kang, J
    Jung, KY
    Song, WY
    O, BH
    Eom, TB
    [J]. METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XVII, PTS 1 AND 2, 2003, 5038 : 935 - 942
  • [37] Observation of suspended carbon nanotube configurations using an atomic force microscopy tip
    Graduate School of Engineering, Yokohama National University, Yokohama 240-8501, Japan
    [J]. Jpn. J. Appl. Phys., 8 Part 1 (0816011-0816015):
  • [38] Observation of Suspended Carbon Nanotube Configurations Using an Atomic Force Microscopy Tip
    Ono, Yuki
    Ogino, Toshio
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 2009, 48 (08) : 0816011 - 0816015
  • [39] Tip characterizer for atomic force microscopy using singly suspended carbon nanotube
    Inaba, Takumi
    Xie, Jianping
    Sugiyama, Ryohei
    Homma, Yoshikazu
    [J]. SURFACE AND INTERFACE ANALYSIS, 2012, 44 (06) : 690 - 693
  • [40] Carbon nanotube tip for scanning tunneling microscope
    Mizutani, Wataru
    Choi, Nami
    Uchihashi, Takayuki
    Tokumoto, Hiroshi
    [J]. Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2001, 40 (6 B): : 4328 - 4330