Use of dielectrophoresis in the fabrication of an atomic force microscope tip with a carbon nanotube: a numerical analysis

被引：53

作者：

Kim, JE ^{[1
]}

Han, CS ^{[1
]}

机构：

[1] KIMM, Nano Mech Syst Res Ctr, Taejon 305343, South Korea

来源：

NANOTECHNOLOGY | 2005年 / 16卷 / 10期

关键词：

D O I：

10.1088/0957-4484/16/10/046

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

To fabricate an atomic force microscope tip with an attached carbon nanotube (CNT), we simulated dielectrophoresis, produced by a nonuniform electric field. We calculated the dielectrophoretic force and torque of CNTs dispersed in a fluid. We then investigated the effect of various parameters such as the initial conditions of the CNT, the distance between the tip and the electrode, and the shape of the tip's apex. Using the results of the simulation, we examined the assembly conditions for achieving a high success rate. In particular, we found that the optimal distance between the tip and the electrode was 10 gm.

引用

页码：2245 / 2250

页数：6

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