Three-dimensional deposition of ZnO thin layer on nanopatterned silicon substrate

被引:1
|
作者
Tian, Ji-Li [1 ]
Wang, Gui-Gen [1 ]
Zhang, Hua-Yu [1 ]
机构
[1] Harbin Inst Technol, Shenzhen Grad Sch, Shenzhen Key Lab Adv Mat, Shenzhen 518055, Peoples R China
关键词
3D ZnO thin layer; Atomic layer deposition; Nanopatterned silicon substrate; Inductively coupled plasma; Microstructure; Semiconductors; TEMPERATURE; NETWORKS; ARRAYS;
D O I
10.1016/j.matlet.2016.06.002
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Three-dimensional deposition of 15 nm thick ZnO thin layer can be achieved successfully on nano patterned silicon substrate. The nanopatterned silicon (NPSi) substrate was prepared by two-step ICP etching using anodic aluminum oxide (AAO) film as etching mask. The average diameter and depth for the silicon nanopore arrays are approximately 60 nm and 300 nm, respectively. Also, the NPSi substrate was entirely covered by ZnO thin layer grown by atomic layer deposition. It is believed that the above mentioned process may provide a good alternative for the preparation of three-dimensional ZnO film and device. (C) 2016 Elsevier B.V. All rights reserved.
引用
收藏
页码:34 / 37
页数:4
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