Assessing SET Sensitivity of Mixed-Signal Circuits at Early Design Stages

被引：0

作者：

Fernandez-Alvarez, Aranzazu ^{[1
]}

Portela-Garcia, Marta ^{[1
]}

Garcia-Valderas, Mario ^{[1
]}

Lopez Ongil, Celia ^{[1
]}

Sordo Ibanez, Samuel ^{[2
]}

Espejo, Servando ^{[3
]}

机构：

[1] Univ Carlos III Madrid, Elect Technol Dept, Leganes, Spain

[2] Inst Astrofis Canarias, San Cristobal la Laguna, Spain

[3] Univ Seville, Inst Microelect Sevilla, Seville, Spain

来源：

2019 XXXIV CONFERENCE ON DESIGN OF CIRCUITS AND INTEGRATED SYSTEMS (DCIS) | 2019年

关键词：

SET; SEU; soft error; colt imjection; mixed-signal; HIT/SW co -simulation;

D O I：

10.1109/dcis201949030.2019.8959892

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Traditionally, the effects of ionizing radiation have been a problem to solve in digital circuits. In analog circuits, the response of the circuits is often slow compared to the duration of the errors produced by the effects of radiation, so these errors were filtered by the circuit. However, the increasing sensitivity of modern technologies, high performance requirements, as well as the current low design margins make SETs also a problem to solve in current analog and mixed signal circuits. In this paper, a fault injection tool to aid designers in the hardening process at early design phases is presented. This tool performs fault injection in digital and analog elements at different abstraction levels to profit from hardware speed keeping significant results from electric simulation. The solution integrates existing techniques for digital circuits together with specific solutions for analog components. Results of fault injection in analog nodes for a case study are detailed.

引用

页数：6

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