Parametric fitting of data obtained from detectors with finite resolution and limited acceptance

被引：4

作者：

Gagunashvili, N. D. ^{[1
]}

机构：

[1] Univ Akureyri, IS-600 Akureyi, Iceland

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2011年 / 635卷 / 01期

关键词：

Fit Monte Carlo distribution to data; Comparison experimental and simulated data; Homogeneity test; Weighted histogram; Inverse problem; Unfolding problem;

D O I：

10.1016/j.nima.2010.12.230

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A goodness-of-fit test for fitting of a parametric model to data obtained from a detector with finite resolution and limited acceptance is proposed. The parameters of the model are found by minimization of a statistic that is used for comparing experimental data and simulated reconstructed data. Numerical examples are presented to illustrate and validate the fitting procedure. (C) 2011 Elsevier B.V. All rights reserved.

引用

页码：86 / 91

页数：6

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