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Bottom-up silicon nanoelectronics
被引:0
|作者:
Mizuta, H
[1
]
Khalafalla, M
[1
]
Durrani, ZAK
[1
]
Uno, S
[1
]
Koshida, N
[1
]
Tsuchiya, Y
[1
]
Oda, S
[1
]
机构:
[1] Tokyo Inst Technol, Dept Phys Elect, Tokyo 152, Japan
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D O I:
暂无
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
This paper presents an overview on recent topical studies on electronic properties and device applications of silicon nanodots as a bottom-up building block for silicon nanoelectronics. The electrostatic and quantum-mechanical interactions in double Si nanodots, the phononic states and electron-phonon interactions in the linear chain of Si nanodots covered with thin oxide layers, and the, non-volatile nanoelectromechanical memory device incorporating Si nanodots are discussed.
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页码:864 / 868
页数:5
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