On-line testing of globally asynchronous circuits

被引：7

作者：

Shang, D ^{[1
]}

Bystrov, A ^{[1
]}

Yakovlev, A ^{[1
]}

Koppad, D ^{[1
]}

机构：

[1] Newcastle Univ, Sch EECE, Newcastle Upon Tyne NE1 7RU, Tyne & Wear, England

来源：

11TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM | 2005年

关键词：

D O I：

10.1109/IOLTS.2005.53

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

The problem of on-line testing of asynchronous circuits is analysed, several infrastructures are proposed and a self-checking tree checker is designed. The checker uses on-demand self-test, which reduces power consumption and guarantees bounded self-test period. Objects under test are tested by observing protocols at their primary inputs and outputs. The checker does not slow down the functional system, as it only samples the signals. The protocols are checked by identifying enabled and refused signal transitions in each state of the system. The fault coverage of internal faults of the checker is calculated. Simulation results are included.

引用

页码：135 / 140

页数：6

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