High-resolution electron microscopy studies of island formation during epitaxial growth of semiconductor layers

被引：0
|
作者：
Jager, W [1 ]
Tillmann, K [1 ]
机构：
[1] Univ Kiel, Dept Engn, Ctr Microanal, D-24143 Kiel, Germany
来源：
ELECTRON MICROSCOPY 1998, VOL 3: MATERIALS SCIENCE 2 | 1998年
关键词：
D O I：
暂无
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：361 / 362
页数：2
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