Advances in Temporary Bonding and Release Technology for Ultrathin Substrate Processing and High-Density Fan-Out Device Build-up

被引:5
|
作者
Phommahaxay, Alain [1 ]
Podpod, Arnita [1 ]
Slabbekoorn, John [1 ]
Sleeckx, Erik [1 ]
Beyer, Gerald [1 ]
Beyne, Eric [1 ]
Guerrero, Alice [2 ]
Bai, Dongshun [2 ]
Arnold, Kim [2 ]
机构
[1] IMEC, Leuven, Belgium
[2] Brewer Sci Inc, Rolla, MO USA
关键词
Wafer bonding; Wafer thinning; Thin wafer handling; Temporary bonding material; adhesive; Die attach; Fan-out; Carrier debonding;
D O I
10.1109/ECTC.2018.00151
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Thin substrate handling has become one of the cornerstone technologies that enabled the development of 3D stacked ICs over the past years. Temporary wafer bonding has continuously improved and reached the maturity level required by volume manufacturing of first generation devices. Yet the need for further development and performance increases remains. Indeed, the continuous push for denser interconnects has brought new requirements for a through-silicon-via technology on one side but also pushed temporary adhesive and carrier technology into the space of wafer reconstruction and fan-out WLP.
引用
收藏
页码:985 / 992
页数:8
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