共 50 条
- [31] Microstructure of titanium oxide films investigated by atomic force microscopy and transmission electron microscopy [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1998, 142 (1-2): : 61 - 66
- [32] Surface characterization of plasma etched DLC films by scanning tunneling microscopy and atomic force microscopy [J]. BEAM INJECTION ASSESSMENT OF MICROSTRUCTURES IN SEMICONDUCTORS, 2000, 2000, 78-79 : 183 - 189
- [34] Femtosecond laser pulse irradiation of Sb-rich AgInSbTe films: Scanning electron microscopy and atomic force microscopy investigations [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2005, 80 (05): : 1039 - 1043
- [37] Quantitative characterization of second-phase particles by atomic force microscopy and scanning electron microscopy [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 2002, 82 (13): : 2575 - 2589