Study of MgO (111) Charging Phenomena Using Scanning Electron Microscopy and Atomic Force Microscopy

被引：1

作者：

Boughariou, Aicha ^{[1
]}

Abdullah, Osama Qays ^{[1
]}

Blaise, Guy ^{[2
]}

机构：

[1] Sfax Univ, Fac Sci Sfax, GEOGLOB Lab, BP 1171, Sfax 3000, Tunisia

[2] Univ Paris Sud XI, LPS, Batiment 510, F-91405 Orsay, France

来源：

PHYSICS OF THE SOLID STATE | 2024年 / 66卷 / 01期

关键词：

MgO (111); SEM; AFM; In sigma; pseudo mirror effect; charge stability; MGO(100); SURFACE;

D O I：

10.1134/S1063783423600085

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

In this article we have studied, using the Scanning Electron Microscopy SEM LEO 440, the surface electrical properties of MgO (111) irradiated with 30 keV electrons. The study of the evolution of the secondary electronic emission of MgO (111) shows that ln sigma increases and reaches a value lower than zero. After an injection of 5000 pC, we observe a pseudo mirror, which is due to a very negative surface potential. Finally, we have shown the very high stability of charges within MgO (111) thanks to the use of Atomic Force Microscopy coupled with Scanning Electron Microscope. We can then conclude that MgO (111) is a good trapping insulator.

引用

页码：20 / 23

页数：4

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