SCANNING ELECTRON MICROSCOPY AND ATOMIC FORCE MICROSCOPY OF CHITOSAN COMPOSITE FILMS (vol 55, pg 352, 2010)

被引：0

作者：

Cardenas, Galo ^{[1
]}

Anaya, Paola ^{[1
]}

Del Rio, Rodrigo ^{[2
]}

Schrebler, Ricardo ^{[2
]}

Von Plessing, Carlos ^{[3
]}

Schneider, Mark ^{[4
]}

机构：

[1] Univ Concepcion, Fac Ciencias Quim, Dept Polimeros, Concepcion, Chile

[2] Pontificia Univ Catolica Valparaiso, Inst Quim, Valparaiso, Chile

[3] Univ Concepcion, Fac Farm, Concepcion, Chile

[4] Univ Saarland, Abt Biopharm & Pharmazeut Technol, Saarbrucken, Germany

来源：

JOURNAL OF THE CHILEAN CHEMICAL SOCIETY | 2010年 / 55卷 / 04期

关键词：

D O I：

暂无

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：IX / IX

页数：1

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[1] SCANNING ELECTRON MICROSCOPY AND ATOMIC FORCE MICROSCOPY OF CHITOSAN COMPOSITE FILMS
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Anaya, Paola
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von Plessing, Carlos
Schneider, Mark
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